TEST_NAME : Wafer
TEST_DATE : 24_10_01-15_13_42
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-036-002-013-11 | FUSED_ID : 6359364768410640603
  IC_TEMP :  -58.76 | VDDM : 1115.31 | AUX_INT :   -7.97 | CsaBias :   75.24
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.11685e-03 / 2
  ADC_P0  : -7.97051e-03 ± 2.26030e-02
  ADC_P1  : 8.38363e-03 ± 5.49350e-04
  ADC_P2  : -6.25623e-06 ± 2.63955e-06
  CSA_Chi2/NDF : 1.20378e-04 / 2
  CSA_P0  : 5.69473e-02 ± 7.31806e-03
  CSA_P1  : 9.10641e-03 ± 5.51363e-04
  CSA_P2  : -3.78203e-05 ± 8.39660e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [123]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2087', '1.800', '0.1031', '1.799', '0.0803', '7.000', '0.7078', 1, 1, 1, 1, 1727788422.391492]
VI_after__Init : ['1.201', '0.2087', '1.800', '0.1032', '1.801', '0.0747', '7.000', '0.7079', 1, 1, 1, 1, 1727788430.7717261]
VI_at__the_End : ['1.202', '0.4767', '1.800', '0.1310', '1.800', '0.1125', '7.000', '0.7087', 1, 1, 1, 1, 1727788499.4971747]