TEST_NAME : Wafer
TEST_DATE : 24_10_01-15_49_44
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-036-003-007-06 | FUSED_ID : 6359364768410644598
  IC_TEMP :  -61.20 | VDDM : 1119.94 | AUX_INT :   -8.20 | CsaBias :   75.96
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.53045e-03 / 2
  ADC_P0  : -8.19848e-03 ± 2.65278e-02
  ADC_P1  : 8.47607e-03 ± 6.54780e-04
  ADC_P2  : -6.07175e-06 ± 3.20794e-06
  CSA_Chi2/NDF : 1.50635e-04 / 2
  CSA_P0  : 5.59908e-02 ± 8.18627e-03
  CSA_P1  : 9.80311e-03 ± 6.16776e-04
  CSA_P2  : -4.57764e-05 ± 9.39277e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [18, 104]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [80, 92]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1773', '1.800', '0.1453', '1.800', '0.0818', '7.000', '0.7081', 1, 1, 1, 1, 1727790583.7696424]
VI_after__Init : ['1.202', '0.1771', '1.800', '0.1453', '1.800', '0.0766', '7.000', '0.7080', 1, 1, 1, 1, 1727790591.7900321]
VI_at__the_End : ['1.202', '0.4878', '1.800', '0.1395', '1.804', '0.1146', '7.000', '0.7088', 1, 1, 1, 1, 1727790654.5015182]