TEST_NAME : Wafer
TEST_DATE : 24_10_01-15_38_16
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-036-003-014-06 | FUSED_ID : 6359364768410644710
  IC_TEMP :  -57.25 | VDDM : 1118.25 | AUX_INT :   -7.94 | CsaBias :   74.89
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.56060e-04 / 2
  ADC_P0  : -7.94456e-03 ± 2.08876e-02
  ADC_P1  : 8.34450e-03 ± 5.04825e-04
  ADC_P2  : -6.15355e-06 ± 2.41670e-06
  CSA_Chi2/NDF : 1.07253e-04 / 2
  CSA_P0  : 5.78144e-02 ± 6.90758e-03
  CSA_P1  : 9.26353e-03 ± 5.20437e-04
  CSA_P2  : -3.91863e-05 ± 7.92563e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [14, 33, 102]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1794', '1.800', '0.1605', '1.800', '0.0894', '7.000', '0.7090', 1, 1, 1, 1, 1727789896.062876]
VI_after__Init : ['1.202', '0.1794', '1.800', '0.1606', '1.800', '0.0821', '7.000', '0.7080', 1, 1, 1, 1, 1727789904.9370325]
VI_at__the_End : ['1.201', '0.4823', '1.800', '0.1357', '1.799', '0.1117', '7.000', '0.7087', 1, 1, 1, 1, 1727789970.3354366]