TEST_NAME : Wafer
TEST_DATE : 24_10_01-15_57_54
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-036-004-010-14 | FUSED_ID : 6359364768410648750
  IC_TEMP :  -59.20 | VDDM : 1121.65 | AUX_INT :   -6.81 | CsaBias :   69.43
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.09919e-03 / 2
  ADC_P0  : -6.81343e-03 ± 2.24309e-02
  ADC_P1  : 8.52969e-03 ± 5.56523e-04
  ADC_P2  : -6.41666e-06 ± 2.72835e-06
  CSA_Chi2/NDF : 1.49819e-04 / 2
  CSA_P0  : 5.88535e-02 ± 8.16404e-03
  CSA_P1  : 9.86406e-03 ± 6.15102e-04
  CSA_P2  : -4.62801e-05 ± 9.36727e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [44]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1987', '1.800', '0.1332', '1.800', '0.0884', '7.000', '0.7075', 1, 1, 1, 1, 1727791074.0053003]
VI_after__Init : ['1.202', '0.1988', '1.800', '0.1332', '1.801', '0.0831', '7.000', '0.7076', 1, 1, 1, 1, 1727791082.0316577]
VI_at__the_End : ['1.202', '0.4922', '1.800', '0.1373', '1.805', '0.1134', '7.000', '0.7084', 1, 1, 1, 1, 1727791145.560845]