TEST_NAME : Wafer
TEST_DATE : 24_10_01-16_14_16
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-036-004-020-09 | FUSED_ID : 6359364768410648905
  IC_TEMP :  -58.82 | VDDM : 1119.90 | AUX_INT :   -8.15 | CsaBias :   76.90
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.24950e-03 / 2
  ADC_P0  : -8.15125e-03 ± 2.39601e-02
  ADC_P1  : 8.56545e-03 ± 6.01775e-04
  ADC_P2  : -6.06543e-06 ± 2.99508e-06
  CSA_Chi2/NDF : 1.56302e-04 / 2
  CSA_P0  : 5.68381e-02 ± 8.33882e-03
  CSA_P1  : 9.74423e-03 ± 6.28270e-04
  CSA_P2  : -4.58657e-05 ± 9.56781e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [54]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.202', '0.3295', '1.800', '0.1213', '1.799', '0.0891', '7.000', '0.7071', 1, 1, 1, 1, 1727792055.743157]
VI_after__Init : ['1.202', '0.3296', '1.800', '0.1214', '1.799', '0.0844', '7.000', '0.7070', 1, 1, 1, 1, 1727792063.7943797]
VI_at__the_End : ['1.202', '0.4852', '1.800', '0.1342', '1.799', '0.1128', '7.000', '0.7078', 1, 1, 1, 1, 1727792127.7498372]