TEST_NAME : Wafer
TEST_DATE : 24_10_01-17_17_41
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-036-006-016-10 | FUSED_ID : 6359364768410657034
  IC_TEMP :  -56.42 | VDDM : 1123.86 | AUX_INT :   -8.67 | CsaBias :   67.98
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.18354e-03 / 2
  ADC_P0  : -8.67241e-03 ± 2.32651e-02
  ADC_P1  : 8.57548e-03 ± 5.75925e-04
  ADC_P2  : -6.54098e-06 ± 2.82601e-06
  CSA_Chi2/NDF : 1.05240e-04 / 2
  CSA_P0  : 5.88370e-02 ± 6.84246e-03
  CSA_P1  : 9.69388e-03 ± 5.15530e-04
  CSA_P2  : -4.41828e-05 ± 7.85091e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [15]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3001', '1.800', '0.1719', '1.800', '0.0912', '7.000', '0.7079', 1, 1, 1, 1, 1727795860.8074965]
VI_after__Init : ['1.201', '0.3002', '1.800', '0.1715', '1.800', '0.0855', '7.000', '0.7079', 1, 1, 1, 1, 1727795868.8649344]
VI_at__the_End : ['1.202', '0.4885', '1.800', '0.1370', '1.800', '0.1121', '7.000', '0.7085', 1, 1, 1, 1, 1727795935.213857]