TEST_NAME : Wafer
TEST_DATE : 24_10_01-17_25_53
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-036-006-021-10 | FUSED_ID : 6359364768410657114
  IC_TEMP :  -64.42 | VDDM : 1116.10 | AUX_INT :  -10.48 | CsaBias :   67.14
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.58670e-03 / 2
  ADC_P0  : -1.04823e-02 ± 2.69550e-02
  ADC_P1  : 8.68469e-03 ± 6.70200e-04
  ADC_P2  : -6.63245e-06 ± 3.32552e-06
  CSA_Chi2/NDF : 2.20604e-04 / 2
  CSA_P0  : 5.84187e-02 ± 9.90671e-03
  CSA_P1  : 1.06577e-02 ± 7.46399e-04
  CSA_P2  : -5.94020e-05 ± 1.13668e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [27]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2445', '1.800', '0.1318', '1.799', '0.0900', '7.000', '0.7089', 1, 1, 1, 1, 1727796353.0602252]
VI_after__Init : ['1.202', '0.2444', '1.800', '0.1317', '1.800', '0.0825', '7.000', '0.7080', 1, 1, 1, 1, 1727796361.250571]
VI_at__the_End : ['1.201', '0.4878', '1.800', '0.1374', '1.799', '0.1144', '7.000', '0.7086', 1, 1, 1, 1, 1727796420.0611138]