TEST_NAME : Wafer
TEST_DATE : 24_10_01-17_30_48
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-036-006-024-10 | FUSED_ID : 6359364768410657162
  IC_TEMP :  -60.56 | VDDM : 1138.44 | AUX_INT : -173.87 | CsaBias :  -35.96
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.61055e-04 / 2
  ADC_P0  : -1.73866e-01 ± 2.68960e-02
  ADC_P1  : 1.08003e-02 ± 6.10230e-04
  ADC_P2  : -1.47976e-05 ± 2.70711e-06
  CSA_Chi2/NDF : 8.71545e-05 / 2
  CSA_P0  : 5.62750e-02 ± 6.22684e-03
  CSA_P1  : 8.93205e-03 ± 4.69147e-04
  CSA_P2  : -3.50551e-05 ± 7.14455e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [61, 99, 121]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [31, 70, 77]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3910', '1.800', '0.1491', '1.800', '0.0957', '7.000', '0.7083', 1, 1, 1, 1, 1727796648.0777624]
VI_after__Init : ['1.202', '0.3876', '1.800', '0.1478', '1.799', '0.0918', '7.000', '0.7079', 1, 1, 1, 1, 1727796656.2331839]
VI_at__the_End : ['1.202', '0.4766', '1.800', '0.1320', '1.803', '0.1114', '7.000', '0.7087', 1, 1, 1, 1, 1727796715.6765661]