TEST_NAME : Wafer
TEST_DATE : 24_10_01-18_06_48
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-036-007-007-00 | FUSED_ID : 6359364768410660976
  IC_TEMP :  -54.95 | VDDM : 1128.80 | AUX_INT :   -8.89 | CsaBias :   91.18
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.42977e-03 / 2
  ADC_P0  : -8.89422e-03 ± 2.56754e-02
  ADC_P1  : 8.40118e-03 ± 6.41409e-04
  ADC_P2  : -5.13837e-06 ± 3.19346e-06
  CSA_Chi2/NDF : 1.42376e-04 / 2
  CSA_P0  : 5.72813e-02 ± 7.95867e-03
  CSA_P1  : 9.92423e-03 ± 5.99628e-04
  CSA_P2  : -4.58308e-05 ± 9.13163e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [71]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3570', '1.800', '0.1501', '1.800', '0.0925', '7.000', '0.7081', 1, 1, 1, 1, 1727798808.0698686]
VI_after__Init : ['1.202', '0.3571', '1.800', '0.1501', '1.800', '0.0867', '7.000', '0.7083', 1, 1, 1, 1, 1727798816.0622828]
VI_at__the_End : ['1.202', '0.4964', '1.800', '0.1398', '1.804', '0.1103', '7.000', '0.7087', 1, 1, 1, 1, 1727798881.1155198]