TEST_NAME : Wafer
TEST_DATE : 24_10_01-18_00_15
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-036-007-011-00 | FUSED_ID : 6359364768410661040
  IC_TEMP :  -58.30 | VDDM : 1121.42 | AUX_INT :   -8.58 | CsaBias :   77.03
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.34144e-03 / 2
  ADC_P0  : -8.58261e-03 ± 2.47990e-02
  ADC_P1  : 8.62794e-03 ± 6.17440e-04
  ADC_P2  : -6.70824e-06 ± 3.04118e-06
  CSA_Chi2/NDF : 1.31532e-04 / 2
  CSA_P0  : 5.85789e-02 ± 7.64959e-03
  CSA_P1  : 9.76530e-03 ± 5.76341e-04
  CSA_P2  : -4.57007e-05 ± 8.77699e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [25, 81]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [39]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3365', '1.800', '0.1581', '1.800', '0.0947', '7.000', '0.7086', 1, 1, 1, 1, 1727798415.1944332]
VI_after__Init : ['1.202', '0.3365', '1.800', '0.1579', '1.800', '0.0877', '7.000', '0.7081', 1, 1, 1, 1, 1727798423.2819076]
VI_at__the_End : ['1.202', '0.4873', '1.800', '0.1370', '1.799', '0.1125', '7.000', '0.7088', 1, 1, 1, 1, 1727798490.2681682]