TEST_NAME : Wafer
TEST_DATE : 24_10_01-17_58_37
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-036-007-012-00 | FUSED_ID : 6359364768410661056
  IC_TEMP :  -61.70 | VDDM : 1121.44 | AUX_INT :   -7.82 | CsaBias :   75.18
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.23037e-03 / 2
  ADC_P0  : -7.81694e-03 ± 2.37853e-02
  ADC_P1  : 8.35477e-03 ± 5.88223e-04
  ADC_P2  : -5.50937e-06 ± 2.88187e-06
  CSA_Chi2/NDF : 1.31952e-04 / 2
  CSA_P0  : 5.88193e-02 ± 7.66179e-03
  CSA_P1  : 9.73837e-03 ± 5.77260e-04
  CSA_P2  : -4.62859e-05 ± 8.79099e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3169', '1.800', '0.1271', '1.799', '0.0908', '7.000', '0.7079', 1, 1, 1, 1, 1727798317.0794997]
VI_after__Init : ['1.202', '0.3169', '1.800', '0.1274', '1.801', '0.0852', '7.000', '0.7081', 1, 1, 1, 1, 1727798325.1639955]
VI_at__the_End : ['1.201', '0.4823', '1.800', '0.1366', '1.805', '0.1141', '7.000', '0.7086', 1, 1, 1, 1, 1727798383.3398073]