TEST_NAME : Wafer
TEST_DATE : 24_10_01-17_53_42
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-036-007-015-00 | FUSED_ID : 6359364768410661104
  IC_TEMP :  -57.49 | VDDM : 1126.54 | AUX_INT :   -9.33 | CsaBias :   83.29
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.56991e-03 / 2
  ADC_P0  : -9.32627e-03 ± 2.68676e-02
  ADC_P1  : 8.48672e-03 ± 6.63168e-04
  ADC_P2  : -6.09510e-06 ± 3.24904e-06
  CSA_Chi2/NDF : 1.38740e-04 / 2
  CSA_P0  : 5.77261e-02 ± 7.85640e-03
  CSA_P1  : 9.88673e-03 ± 5.91923e-04
  CSA_P2  : -4.70303e-05 ± 9.01429e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [19, 21]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [42]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3279', '1.800', '0.1356', '1.799', '0.0866', '7.000', '0.7082', 1, 1, 1, 1, 1727798022.5447257]
VI_after__Init : ['1.202', '0.3279', '1.800', '0.1356', '1.801', '0.0811', '7.000', '0.7079', 1, 1, 1, 1, 1727798030.7111032]
VI_at__the_End : ['1.201', '0.4899', '1.800', '0.1407', '1.804', '0.1114', '7.000', '0.7085', 1, 1, 1, 1, 1727798089.7355812]