TEST_NAME : Wafer
TEST_DATE : 24_10_01-18_36_16
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-036-008-015-04 | FUSED_ID : 6359364768410665204
  IC_TEMP :  -69.73 | VDDM : 1138.54 | AUX_INT :  -10.05 | CsaBias :   81.47
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.25445e-03 / 2
  ADC_P0  : -1.00519e-02 ± 2.37830e-02
  ADC_P1  : 9.24993e-03 ± 5.95129e-04
  ADC_P2  : -9.77128e-06 ± 2.94081e-06
  CSA_Chi2/NDF : 1.14205e-04 / 2
  CSA_P0  : 6.01196e-02 ± 7.12795e-03
  CSA_P1  : 9.80898e-03 ± 5.37040e-04
  CSA_P2  : -4.54820e-05 ± 8.17848e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [13]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4446', '1.800', '0.1749', '1.800', '0.0979', '7.000', '0.7076', 1, 1, 1, 1, 1727800576.0285726]
VI_after__Init : ['1.201', '0.4453', '1.800', '0.1751', '1.800', '0.0905', '7.000', '0.7070', 1, 1, 1, 1, 1727800584.0439768]
VI_at__the_End : ['1.201', '0.4938', '1.800', '0.1444', '1.802', '0.1139', '7.000', '0.7076', 1, 1, 1, 1, 1727800652.5793076]