TEST_NAME : Wafer
TEST_DATE : 24_10_01-18_44_27
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-036-008-020-03 | FUSED_ID : 6359364768410665283
  IC_TEMP :  -62.63 | VDDM : 1128.21 | AUX_INT : -167.30 | CsaBias :  -69.54
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 7.43076e-04 / 2
  ADC_P0  : -1.67302e-01 ± 2.47616e-02
  ADC_P1  : 1.09962e-02 ± 5.83983e-04
  ADC_P2  : -1.48517e-05 ± 2.70408e-06
  CSA_Chi2/NDF : 1.44861e-04 / 2
  CSA_P0  : 5.99913e-02 ± 8.02784e-03
  CSA_P1  : 1.01446e-02 ± 6.04840e-04
  CSA_P2  : -5.17602e-05 ± 9.21100e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [73, 109, 123]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [43, 74, 122]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3437', '1.800', '0.1441', '1.800', '0.0912', '7.000', '0.7073', 1, 1, 1, 1, 1727801067.5062022]
VI_after__Init : ['1.202', '0.3435', '1.800', '0.1445', '1.800', '0.0867', '7.000', '0.7075', 1, 1, 1, 1, 1727801075.537627]
VI_at__the_End : ['1.201', '0.4892', '1.800', '0.1417', '1.800', '0.1129', '7.000', '0.7080', 1, 1, 1, 1, 1727801135.6578422]