TEST_NAME : Wafer
TEST_DATE : 24_10_01-19_38_30
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-036-009-002-09 | FUSED_ID : 6359364768410669097
  IC_TEMP :  -66.58 | VDDM : 1122.94 | AUX_INT :   -9.41 | CsaBias :   69.40
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.45958e-03 / 2
  ADC_P0  : -9.41095e-03 ± 2.58650e-02
  ADC_P1  : 8.81898e-03 ± 6.56224e-04
  ADC_P2  : -6.96301e-06 ± 3.30265e-06
  CSA_Chi2/NDF : 1.92819e-04 / 2
  CSA_P0  : 5.65323e-02 ± 9.26183e-03
  CSA_P1  : 1.02458e-02 ± 6.97812e-04
  CSA_P2  : -5.18654e-05 ± 1.06269e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [64, 72]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3575', '1.800', '0.1227', '1.799', '0.0881', '7.000', '0.7079', 1, 1, 1, 1, 1727804309.8783913]
VI_after__Init : ['1.201', '0.3577', '1.800', '0.1224', '1.799', '0.0880', '7.000', '0.7078', 1, 1, 1, 1, 1727804317.8366132]
VI_at__the_End : ['1.202', '0.4943', '1.800', '0.1403', '1.799', '0.1124', '7.000', '0.7087', 1, 1, 1, 1, 1727804386.6684248]