TEST_NAME : Wafer
TEST_DATE : 24_10_01-19_45_02
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-036-010-005-07 | FUSED_ID : 6359364768410673239
  IC_TEMP :  -61.88 | VDDM : 1113.30 | AUX_INT :   -8.39 | CsaBias :   75.05
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.28354e-03 / 2
  ADC_P0  : -8.38733e-03 ± 2.42754e-02
  ADC_P1  : 8.40240e-03 ± 5.97111e-04
  ADC_P2  : -5.86791e-06 ± 2.91181e-06
  CSA_Chi2/NDF : 1.92165e-04 / 2
  CSA_P0  : 5.81739e-02 ± 9.24611e-03
  CSA_P1  : 1.04358e-02 ± 6.96628e-04
  CSA_P2  : -5.51127e-05 ± 1.06088e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [103, 115]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [8, 72, 83]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2260', '1.800', '0.1245', '1.800', '0.0902', '7.000', '0.7089', 1, 1, 1, 1, 1727804702.2982545]
VI_after__Init : ['1.202', '0.2261', '1.800', '0.1245', '1.801', '0.0830', '7.000', '0.7077', 1, 1, 1, 1, 1727804710.3836608]
VI_at__the_End : ['1.198', '0.4945', '1.800', '0.1415', '1.800', '0.1132', '7.000', '0.7084', 1, 1, 1, 1, 1727804778.7749817]