TEST_NAME : Wafer
TEST_DATE : 24_10_01-20_57_02
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-036-011-006-10 | FUSED_ID : 6359364768410677354
  IC_TEMP :  -56.55 | VDDM : 1126.50 | AUX_INT :   -7.95 | CsaBias :   84.96
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.25746e-03 / 2
  ADC_P0  : -7.94795e-03 ± 2.40636e-02
  ADC_P1  : 7.79882e-03 ± 5.56846e-04
  ADC_P2  : -4.67415e-06 ± 2.55643e-06
  CSA_Chi2/NDF : 1.21483e-04 / 2
  CSA_P0  : 5.74935e-02 ± 7.35158e-03
  CSA_P1  : 9.68294e-03 ± 5.53888e-04
  CSA_P2  : -4.42282e-05 ± 8.43506e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [20]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [3]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3638', '1.800', '0.1441', '1.800', '0.0911', '7.000', '0.7079', 1, 1, 1, 1, 1727809022.2649922]
VI_after__Init : ['1.202', '0.3636', '1.800', '0.1439', '1.800', '0.0855', '7.000', '0.7083', 1, 1, 1, 1, 1727809030.2994652]
VI_at__the_End : ['1.202', '0.4894', '1.800', '0.1377', '1.803', '0.1110', '7.000', '0.7088', 1, 1, 1, 1, 1727809095.8032117]