TEST_NAME : Wafer
TEST_DATE : 24_10_01-21_06_52
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-036-012-003-02 | FUSED_ID : 6359364768410681394
  IC_TEMP :  -62.12 | VDDM : 1116.62 | AUX_INT :   -8.35 | CsaBias :   68.47
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.21565e-03 / 2
  ADC_P0  : -8.35132e-03 ± 2.35636e-02
  ADC_P1  : 8.59911e-03 ± 5.79632e-04
  ADC_P2  : -7.04009e-06 ± 2.81263e-06
  CSA_Chi2/NDF : 1.32935e-04 / 2
  CSA_P0  : 5.92337e-02 ± 7.69029e-03
  CSA_P1  : 9.76637e-03 ± 5.79408e-04
  CSA_P2  : -4.44356e-05 ± 8.82370e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [91]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3316', '1.800', '0.1474', '1.800', '0.0940', '7.000', '0.7088', 1, 1, 1, 1, 1727809612.0157084]
VI_after__Init : ['1.202', '0.3320', '1.800', '0.1475', '1.799', '0.0866', '7.000', '0.7080', 1, 1, 1, 1, 1727809620.1150076]
VI_at__the_End : ['1.202', '0.4943', '1.800', '0.1400', '1.801', '0.1118', '7.000', '0.7086', 1, 1, 1, 1, 1727809679.5334103]