TEST_NAME : Wafer
TEST_DATE : 24_10_01-21_13_25
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-036-012-007-02 | FUSED_ID : 6359364768410681458
  IC_TEMP :  -58.07 | VDDM : 1134.48 | AUX_INT : -167.88 | CsaBias :  -38.86
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.12437e-04 / 2
  ADC_P0  : -1.67883e-01 ± 2.72434e-02
  ADC_P1  : 1.09318e-02 ± 6.29280e-04
  ADC_P2  : -1.49958e-05 ± 2.85839e-06
  CSA_Chi2/NDF : 1.08140e-04 / 2
  CSA_P0  : 5.78697e-02 ± 6.93610e-03
  CSA_P1  : 1.00364e-02 ± 5.22585e-04
  CSA_P2  : -4.63165e-05 ± 7.95836e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [35, 100, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3077', '1.800', '0.1685', '1.800', '0.0964', '7.000', '0.7086', 1, 1, 1, 1, 1727810004.8051152]
VI_after__Init : ['1.202', '0.3077', '1.800', '0.1685', '1.801', '0.0895', '7.000', '0.7079', 1, 1, 1, 1, 1727810012.9244237]
VI_at__the_End : ['1.202', '0.5015', '1.800', '0.1397', '1.803', '0.1128', '7.000', '0.7090', 1, 1, 1, 1, 1727810073.8167295]