TEST_NAME : Wafer
TEST_DATE : 24_10_01-21_21_35
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-036-012-012-02 | FUSED_ID : 6359364768410681538
  IC_TEMP :  -54.92 | VDDM : 1107.89 | AUX_INT :   -7.50 | CsaBias :   90.68
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.24271e-03 / 2
  ADC_P0  : -7.49723e-03 ± 2.38780e-02
  ADC_P1  : 8.25040e-03 ± 5.75452e-04
  ADC_P2  : -5.71992e-06 ± 2.75060e-06
  CSA_Chi2/NDF : 1.04895e-04 / 2
  CSA_P0  : 5.72321e-02 ± 6.83124e-03
  CSA_P1  : 9.69740e-03 ± 5.14684e-04
  CSA_P2  : -4.29162e-05 ± 7.83803e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3605', '1.800', '0.1671', '1.800', '0.0941', '7.000', '0.7083', 1, 1, 1, 1, 1727810495.4683301]
VI_after__Init : ['1.202', '0.3605', '1.800', '0.1672', '1.800', '0.0890', '7.000', '0.7082', 1, 1, 1, 1, 1727810503.544761]
VI_at__the_End : ['1.202', '0.4920', '1.800', '0.1387', '1.804', '0.1107', '7.000', '0.7087', 1, 1, 1, 1, 1727810571.0486178]