TEST_NAME : Wafer
TEST_DATE : 24_10_01-21_26_29
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-036-012-015-02 | FUSED_ID : 6359364768410681586
  IC_TEMP :  -57.89 | VDDM : 1121.26 | AUX_INT :   -7.45 | CsaBias :   80.67
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.02690e-03 / 2
  ADC_P0  : -7.44720e-03 ± 2.16697e-02
  ADC_P1  : 8.07574e-03 ± 5.07078e-04
  ADC_P2  : -5.89882e-06 ± 2.34108e-06
  CSA_Chi2/NDF : 1.27945e-04 / 2
  CSA_P0  : 5.51547e-02 ± 7.54457e-03
  CSA_P1  : 9.52531e-03 ± 5.68429e-04
  CSA_P2  : -4.30553e-05 ± 8.65650e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [58]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3002', '1.800', '0.1700', '1.800', '0.0970', '7.000', '0.7080', 1, 1, 1, 1, 1727810789.212239]
VI_after__Init : ['1.202', '0.3003', '1.800', '0.1700', '1.799', '0.0913', '7.000', '0.7081', 1, 1, 1, 1, 1727810797.3296301]
VI_at__the_End : ['1.202', '0.4804', '1.800', '0.1348', '1.800', '0.1113', '7.000', '0.7087', 1, 1, 1, 1, 1727810856.9820454]