TEST_NAME : Wafer
TEST_DATE : 24_10_01-21_29_46
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-036-012-017-05 | FUSED_ID : 6359364768410681621
  IC_TEMP :  -59.70 | VDDM : 1122.06 | AUX_INT :   -7.97 | CsaBias :   85.72
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.31889e-03 / 2
  ADC_P0  : -7.96515e-03 ± 2.46051e-02
  ADC_P1  : 8.58394e-03 ± 6.16605e-04
  ADC_P2  : -6.09993e-06 ± 3.07179e-06
  CSA_Chi2/NDF : 1.29706e-04 / 2
  CSA_P0  : 5.82984e-02 ± 7.59631e-03
  CSA_P1  : 1.01542e-02 ± 5.72327e-04
  CSA_P2  : -5.11728e-05 ± 8.71587e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [1, 23]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [12, 30, 45, 84]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4326', '1.800', '0.1297', '1.800', '0.0968', '7.000', '0.7079', 1, 1, 1, 1, 1727810986.043424]
VI_after__Init : ['1.202', '0.4331', '1.800', '0.1299', '1.800', '0.0914', '7.000', '0.7083', 1, 1, 1, 1, 1727810994.0748274]
VI_at__the_End : ['1.202', '0.4902', '1.800', '0.1391', '1.810', '0.1125', '7.000', '0.7089', 1, 1, 1, 1, 1727811060.0387695]