TEST_NAME : Wafer
TEST_DATE : 24_10_01-21_39_34
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-036-012-023-05 | FUSED_ID : 6359364768410681717
  IC_TEMP :  -55.23 | VDDM : 1125.49 | AUX_INT :   -7.94 | CsaBias :   84.19
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.32422e-03 / 2
  ADC_P0  : -7.94280e-03 ± 2.46385e-02
  ADC_P1  : 8.44431e-03 ± 6.02781e-04
  ADC_P2  : -6.21287e-06 ± 2.92575e-06
  CSA_Chi2/NDF : 9.93637e-05 / 2
  CSA_P0  : 6.01339e-02 ± 6.64869e-03
  CSA_P1  : 9.62119e-03 ± 5.00931e-04
  CSA_P2  : -4.08102e-05 ± 7.62858e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [1, 67]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [101]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3354', '1.800', '0.1905', '1.799', '0.0901', '7.000', '0.7079', 1, 1, 1, 1, 1727811574.1124206]
VI_after__Init : ['1.202', '0.3353', '1.800', '0.1905', '1.800', '0.0845', '7.000', '0.7080', 1, 1, 1, 1, 1727811582.7997918]
VI_at__the_End : ['1.202', '0.4999', '1.800', '0.1411', '1.801', '0.1116', '7.000', '0.7090', 1, 1, 1, 1, 1727811650.5616062]