TEST_NAME : Wafer
TEST_DATE : 24_10_01-22_25_26
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-036-013-003-15 | FUSED_ID : 6359364768410685503
  IC_TEMP :  -60.31 | VDDM : 1104.83 | AUX_INT :  -18.06 | CsaBias :   73.22
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.74079e-03 / 2
  ADC_P0  : -1.80634e-02 ± 2.88449e-02
  ADC_P1  : 8.35921e-03 ± 6.99870e-04
  ADC_P2  : -5.52373e-06 ± 3.37906e-06
  CSA_Chi2/NDF : 1.63600e-04 / 2
  CSA_P0  : 5.77458e-02 ± 8.53128e-03
  CSA_P1  : 9.87674e-03 ± 6.42771e-04
  CSA_P2  : -4.64095e-05 ± 9.78864e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1383', '1.800', '0.1443', '1.800', '0.0858', '7.000', '0.7075', 1, 1, 1, 1, 1727814325.6679492]
VI_after__Init : ['1.201', '0.1383', '1.800', '0.1442', '1.800', '0.0803', '7.000', '0.7072', 1, 1, 1, 1, 1727814333.7952957]
VI_at__the_End : ['1.201', '0.4913', '1.800', '0.1377', '1.800', '0.1133', '7.000', '0.7080', 1, 1, 1, 1, 1727814402.273149]