TEST_NAME : Wafer
TEST_DATE : 24_10_01-22_10_42
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-036-013-012-15 | FUSED_ID : 6359364768410685647
  IC_TEMP :  -61.13 | VDDM : 1124.71 | AUX_INT :   -9.79 | CsaBias :   74.86
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.63684e-03 / 2
  ADC_P0  : -9.79369e-03 ± 2.74135e-02
  ADC_P1  : 8.52933e-03 ± 6.73003e-04
  ADC_P2  : -6.44000e-06 ± 3.28174e-06
  CSA_Chi2/NDF : 1.78699e-04 / 2
  CSA_P0  : 5.95107e-02 ± 8.91628e-03
  CSA_P1  : 1.01952e-02 ± 6.71778e-04
  CSA_P2  : -5.28394e-05 ± 1.02304e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [57]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2089', '1.800', '0.1264', '1.799', '0.0889', '7.000', '0.7077', 1, 1, 1, 1, 1727813441.5075052]
VI_after__Init : ['1.201', '0.2089', '1.800', '0.1264', '1.801', '0.0811', '7.000', '0.7069', 1, 1, 1, 1, 1727813450.427851]
VI_at__the_End : ['1.201', '0.4901', '1.800', '0.1381', '1.804', '0.1145', '7.000', '0.7076', 1, 1, 1, 1, 1727813514.2739758]