TEST_NAME : Wafer
TEST_DATE : 24_10_01-22_07_25
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-036-013-014-15 | FUSED_ID : 6359364768410685679
  IC_TEMP :  -59.99 | VDDM : 1118.00 | AUX_INT :   -7.94 | CsaBias :   69.69
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.11436e-03 / 2
  ADC_P0  : -7.94332e-03 ± 2.26001e-02
  ADC_P1  : 8.68321e-03 ± 5.74547e-04
  ADC_P2  : -6.33141e-06 ± 2.89174e-06
  CSA_Chi2/NDF : 1.10740e-04 / 2
  CSA_P0  : 6.09340e-02 ± 7.01899e-03
  CSA_P1  : 9.63242e-03 ± 5.28830e-04
  CSA_P2  : -4.49922e-05 ± 8.05345e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [55, 90]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3493', '1.800', '0.1573', '1.799', '0.0883', '7.000', '0.7072', 1, 1, 1, 1, 1727813245.2821763]
VI_after__Init : ['1.202', '0.3496', '1.800', '0.1574', '1.801', '0.0826', '7.000', '0.7071', 1, 1, 1, 1, 1727813253.994502]
VI_at__the_End : ['1.202', '0.4866', '1.800', '0.1398', '1.801', '0.1134', '7.000', '0.7076', 1, 1, 1, 1, 1727813320.7795107]