TEST_NAME : Wafer
TEST_DATE : 24_10_01-22_02_30
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-036-013-017-08 | FUSED_ID : 6359364768410685720
  IC_TEMP :  -56.14 | VDDM : 1126.07 | AUX_INT :  -66.83 | CsaBias :   36.36
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.81699e-03 / 2
  ADC_P0  : -6.68280e-02 ± 3.22815e-02
  ADC_P1  : 9.48273e-03 ± 7.86793e-04
  ADC_P2  : -9.30445e-06 ± 3.80065e-06
  CSA_Chi2/NDF : 1.27631e-04 / 2
  CSA_P0  : 6.01644e-02 ± 7.53529e-03
  CSA_P1  : 1.01592e-02 ± 5.67729e-04
  CSA_P2  : -5.00904e-05 ± 8.64585e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [62, 82]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2673', '1.800', '0.1505', '1.799', '0.0878', '7.000', '0.7076', 1, 1, 1, 1, 1727812949.609982]
VI_after__Init : ['1.202', '0.2674', '1.800', '0.1506', '1.799', '0.0822', '7.000', '0.7072', 1, 1, 1, 1, 1727812957.7283149]
VI_at__the_End : ['1.202', '0.4955', '1.800', '0.1388', '1.800', '0.1116', '7.000', '0.7079', 1, 1, 1, 1, 1727813024.3325114]