TEST_NAME : Wafer
TEST_DATE : 24_10_01-22_38_31
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-036-014-010-01 | FUSED_ID : 6359364768410689697
  IC_TEMP :  -57.00 | VDDM : 1128.15 | AUX_INT :   -8.77 | CsaBias :   98.00
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.48013e-03 / 2
  ADC_P0  : -8.77072e-03 ± 2.60980e-02
  ADC_P1  : 8.28599e-03 ± 6.34452e-04
  ADC_P2  : -5.58914e-06 ± 3.06056e-06
  CSA_Chi2/NDF : 1.01002e-04 / 2
  CSA_P0  : 5.93344e-02 ± 6.70328e-03
  CSA_P1  : 9.75759e-03 ± 5.05044e-04
  CSA_P2  : -4.24373e-05 ± 7.69122e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [31]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [110]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2079', '1.800', '0.1412', '1.799', '0.0884', '7.000', '0.7076', 1, 1, 1, 1, 1727815110.8053653]
VI_after__Init : ['1.201', '0.2078', '1.800', '0.1412', '1.800', '0.0829', '7.000', '0.7075', 1, 1, 1, 1, 1727815119.0606487]
VI_at__the_End : ['1.201', '0.5002', '1.800', '0.1407', '1.804', '0.1104', '7.000', '0.7082', 1, 1, 1, 1, 1727815178.9586003]