TEST_NAME : Wafer
TEST_DATE : 24_10_01-22_40_10
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-036-014-011-01 | FUSED_ID : 6359364768410689713
  IC_TEMP :  -51.17 | VDDM : 1126.58 | AUX_INT :   -8.39 | CsaBias :   91.60
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.28354e-03 / 2
  ADC_P0  : -8.38733e-03 ± 2.42754e-02
  ADC_P1  : 8.40240e-03 ± 5.97111e-04
  ADC_P2  : -5.86791e-06 ± 2.91181e-06
  CSA_Chi2/NDF : 6.63054e-05 / 2
  CSA_P0  : 5.99918e-02 ± 5.43121e-03
  CSA_P1  : 9.18854e-03 ± 4.09203e-04
  CSA_P2  : -3.55007e-05 ± 6.23167e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [21, 94]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3136', '1.800', '0.1497', '1.800', '0.0909', '7.000', '0.7073', 1, 1, 1, 1, 1727815209.6550398]
VI_after__Init : ['1.201', '0.3138', '1.800', '0.1498', '1.799', '0.0856', '7.000', '0.7076', 1, 1, 1, 1, 1727815218.4355385]
VI_at__the_End : ['1.201', '0.4943', '1.800', '0.1366', '1.800', '0.1101', '7.000', '0.7081', 1, 1, 1, 1, 1727815285.7906892]