TEST_NAME : Wafer
TEST_DATE : 24_10_01-22_58_02
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-036-014-022-06 | FUSED_ID : 6359364768410689894
  IC_TEMP :  -56.13 | VDDM : 1123.67 | AUX_INT :  -18.38 | CsaBias :   79.62
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.92199e-03 / 2
  ADC_P0  : -1.83848e-02 ± 3.03454e-02
  ADC_P1  : 8.22643e-03 ± 7.30163e-04
  ADC_P2  : -4.98052e-06 ± 3.50709e-06
  CSA_Chi2/NDF : 1.57392e-04 / 2
  CSA_P0  : 5.87693e-02 ± 8.36784e-03
  CSA_P1  : 1.02306e-02 ± 6.30457e-04
  CSA_P2  : -4.87247e-05 ± 9.60111e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [55, 60, 116]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [13, 28, 40, 107]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3318', '1.800', '0.1573', '1.800', '0.0911', '7.000', '0.7077', 1, 1, 1, 1, 1727816282.2373588]
VI_after__Init : ['1.201', '0.3319', '1.800', '0.1573', '1.800', '0.0855', '7.000', '0.7078', 1, 1, 1, 1, 1727816290.238789]
VI_at__the_End : ['1.201', '0.5065', '1.800', '0.1403', '1.799', '0.1107', '7.000', '0.7083', 1, 1, 1, 1, 1727816350.73299]