TEST_NAME : Wafer
TEST_DATE : 24_10_01-23_20_56
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-036-015-016-11 | FUSED_ID : 6359364768410693899
  IC_TEMP :  -55.21 | VDDM : 1126.84 | AUX_INT :   -6.59 | CsaBias :   66.12
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.70422e-04 / 2
  ADC_P0  : -6.59020e-03 ± 1.99418e-02
  ADC_P1  : 8.13148e-03 ± 4.74406e-04
  ADC_P2  : -5.81000e-06 ± 2.22301e-06
  CSA_Chi2/NDF : 6.25966e-05 / 2
  CSA_P0  : 5.84068e-02 ± 5.27713e-03
  CSA_P1  : 9.26449e-03 ± 3.97594e-04
  CSA_P2  : -3.74140e-05 ± 6.05488e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1305', '1.800', '0.1713', '1.800', '0.0820', '7.000', '0.7086', 1, 1, 1, 1, 1727817656.0882514]
VI_after__Init : ['1.202', '0.1306', '1.800', '0.1713', '1.800', '0.0747', '7.000', '0.7078', 1, 1, 1, 1, 1727817664.1396828]
VI_at__the_End : ['1.201', '0.4926', '1.800', '0.1365', '1.804', '0.1093', '7.000', '0.7083', 1, 1, 1, 1, 1727817728.251648]