TEST_NAME : Wafer
TEST_DATE : 24_10_01-23_50_25
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-036-016-011-04 | FUSED_ID : 6359364768410697908
  IC_TEMP :  -55.73 | VDDM : 1122.91 | AUX_INT :   -7.02 | CsaBias :   73.91
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.28874e-04 / 2
  ADC_P0  : -7.01908e-03 ± 2.06438e-02
  ADC_P1  : 8.14497e-03 ± 4.98484e-04
  ADC_P2  : -5.24541e-06 ± 2.38274e-06
  CSA_Chi2/NDF : 9.60741e-05 / 2
  CSA_P0  : 5.66387e-02 ± 6.53771e-03
  CSA_P1  : 9.22034e-03 ± 4.92569e-04
  CSA_P2  : -3.78430e-05 ± 7.50125e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [6]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2664', '1.800', '0.1569', '1.799', '0.0887', '7.000', '0.7077', 1, 1, 1, 1, 1727819425.2258608]
VI_after__Init : ['1.202', '0.2667', '1.800', '0.1568', '1.800', '0.0835', '7.000', '0.7076', 1, 1, 1, 1, 1727819433.9443536]
VI_at__the_End : ['1.202', '0.4839', '1.800', '0.1362', '1.802', '0.1118', '7.000', '0.7083', 1, 1, 1, 1, 1727819495.6560957]