TEST_NAME : Wafer
TEST_DATE : 24_10_01-23_58_28
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-036-016-016-03 | FUSED_ID : 6359364768410697987
  IC_TEMP :  -54.91 | VDDM : 1116.14 | AUX_INT :   -7.68 | CsaBias :   93.73
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.58622e-03 / 2
  ADC_P0  : -7.68224e-03 ± 2.70384e-02
  ADC_P1  : 7.86597e-03 ± 6.25798e-04
  ADC_P2  : -5.01809e-06 ± 2.87039e-06
  CSA_Chi2/NDF : 7.72789e-05 / 2
  CSA_P0  : 5.80312e-02 ± 5.86345e-03
  CSA_P1  : 9.22654e-03 ± 4.41768e-04
  CSA_P2  : -3.58500e-05 ± 6.72761e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [88, 91, 124]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [34]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4347', '1.800', '0.1308', '1.800', '0.0931', '7.000', '0.7076', 1, 1, 1, 1, 1727819907.8646102]
VI_after__Init : ['1.202', '0.4351', '1.800', '0.1309', '1.800', '0.0877', '7.000', '0.7077', 1, 1, 1, 1, 1727819915.8739343]
VI_at__the_End : ['1.202', '0.4923', '1.800', '0.1358', '1.800', '0.1119', '7.000', '0.7083', 1, 1, 1, 1, 1727819982.6642404]