TEST_NAME : Wafer
TEST_DATE : 24_10_02-00_36_04
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-036-017-007-09 | FUSED_ID : 6359364768410701945
  IC_TEMP :  -57.07 | VDDM : 1128.35 | AUX_INT :   -7.96 | CsaBias :   90.54
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.50300e-03 / 2
  ADC_P0  : -7.95705e-03 ± 2.62988e-02
  ADC_P1  : 8.27452e-03 ± 6.39334e-04
  ADC_P2  : -5.54017e-06 ± 3.08411e-06
  CSA_Chi2/NDF : 8.71403e-05 / 2
  CSA_P0  : 5.59454e-02 ± 6.22633e-03
  CSA_P1  : 9.40387e-03 ± 4.69109e-04
  CSA_P2  : -3.68122e-05 ± 7.14397e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [112]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1469', '1.800', '0.1375', '1.800', '0.0796', '7.000', '0.7078', 1, 1, 1, 1, 1727822163.600213]
VI_after__Init : ['1.202', '0.1469', '1.800', '0.1375', '1.800', '0.0739', '7.000', '0.7076', 1, 1, 1, 1, 1727822171.8035784]
VI_at__the_End : ['1.202', '0.4991', '1.800', '0.1381', '1.800', '0.1110', '7.000', '0.7086', 1, 1, 1, 1, 1727822240.5324044]