TEST_NAME : Wafer
TEST_DATE : 24_10_02-00_31_09
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-036-017-010-09 | FUSED_ID : 6359364768410701993
  IC_TEMP :  -61.98 | VDDM : 1113.01 | AUX_INT :   -9.20 | CsaBias :   81.44
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.35453e-03 / 2
  ADC_P0  : -9.19524e-03 ± 2.49105e-02
  ADC_P1  : 8.30670e-03 ± 5.97162e-04
  ADC_P2  : -6.07760e-06 ± 2.84128e-06
  CSA_Chi2/NDF : 1.35709e-04 / 2
  CSA_P0  : 5.80501e-02 ± 7.77011e-03
  CSA_P1  : 9.74554e-03 ± 5.85422e-04
  CSA_P2  : -4.38755e-05 ± 8.91528e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [34]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [16, 62, 63]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3358', '1.800', '0.1436', '1.800', '0.0880', '7.000', '0.7078', 1, 1, 1, 1, 1727821868.876509]
VI_after__Init : ['1.202', '0.3361', '1.800', '0.1436', '1.800', '0.0828', '7.000', '0.7076', 1, 1, 1, 1, 1727821876.895946]
VI_at__the_End : ['1.202', '0.4938', '1.800', '0.1363', '1.801', '0.1142', '7.000', '0.7086', 1, 1, 1, 1, 1727821945.411762]