TEST_NAME : Wafer
TEST_DATE : 24_10_02-00_18_10
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-036-017-018-14 | FUSED_ID : 6359364768410702126
  IC_TEMP :  -59.53 | VDDM : 1113.91 | AUX_INT :   -7.97 | CsaBias :   85.80
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.42056e-03 / 2
  ADC_P0  : -7.97305e-03 ± 2.55335e-02
  ADC_P1  : 7.87920e-03 ± 5.83183e-04
  ADC_P2  : -5.42140e-06 ± 2.64025e-06
  CSA_Chi2/NDF : 8.21958e-05 / 2
  CSA_P0  : 5.94304e-02 ± 6.04710e-03
  CSA_P1  : 9.15559e-03 ± 4.55605e-04
  CSA_P2  : -3.70305e-05 ± 6.93833e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [77]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [108, 116]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4788', '1.800', '0.1725', '1.800', '0.0992', '7.000', '0.7076', 1, 1, 1, 1, 1727821090.318452]
VI_after__Init : ['1.202', '0.4790', '1.800', '0.1728', '1.800', '0.0935', '7.000', '0.7077', 1, 1, 1, 1, 1727821098.3198042]
VI_at__the_End : ['1.202', '0.4840', '1.800', '0.1342', '1.800', '0.1128', '7.000', '0.7084', 1, 1, 1, 1, 1727821164.8925014]