TEST_NAME : Wafer
TEST_DATE : 24_10_02-00_55_35
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-036-018-020-00 | FUSED_ID : 6359364768410706240
  IC_TEMP :  -61.32 | VDDM : 1120.62 | AUX_INT :  -10.22 | CsaBias :   86.62
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.89213e-03 / 2
  ADC_P0  : -1.02228e-02 ± 2.94830e-02
  ADC_P1  : 8.13900e-03 ± 6.87970e-04
  ADC_P2  : -5.70517e-06 ± 3.21053e-06
  CSA_Chi2/NDF : 1.50940e-04 / 2
  CSA_P0  : 5.97754e-02 ± 8.19454e-03
  CSA_P1  : 9.96166e-03 ± 6.17400e-04
  CSA_P2  : -4.52908e-05 ± 9.40226e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [81]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [70]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2036', '1.800', '0.1539', '1.800', '0.0876', '7.000', '0.7077', 1, 1, 1, 1, 1727823334.9394026]
VI_after__Init : ['1.202', '0.2038', '1.800', '0.1539', '1.800', '0.0817', '7.000', '0.7078', 1, 1, 1, 1, 1727823343.0297582]
VI_at__the_End : ['1.202', '0.5034', '1.800', '0.1391', '1.800', '0.1143', '7.000', '0.7086', 1, 1, 1, 1, 1727823401.6451664]