TEST_NAME : Wafer
TEST_DATE : 24_10_08-12_02_40
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-037-002-010-03 | FUSED_ID : 6359364768411689123
  IC_TEMP : -114.37 | VDDM : 1103.29 | AUX_INT :  -13.33 | CsaBias :   44.58
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.42894e-03 / 2
  ADC_P0  : -1.33318e-02 ± 3.33032e-02
  ADC_P1  : 9.71177e-03 ± 8.82727e-04
  ADC_P2  : -9.89583e-06 ± 4.66896e-06
  CSA_Chi2/NDF : 8.88835e-05 / 2
  CSA_P0  : 5.61026e-02 ± 6.28829e-03
  CSA_P1  : 1.00733e-02 ± 4.73778e-04
  CSA_P2  : -7.46159e-05 ± 7.21507e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [55, 93, 108]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [52, 107]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3635', '1.800', '0.1371', '1.800', '0.0958', '7.000', '0.7075', 1, 1, 1, 1, 1728381759.3694322]
VI_after__Init : ['1.201', '0.3691', '1.800', '0.1380', '1.800', '0.0913', '7.000', '0.7078', 1, 1, 1, 1, 1728381767.6007624]
VI_at__the_End : ['1.201', '0.3928', '1.800', '0.1326', '1.800', '0.1251', '7.000', '0.7082', 1, 1, 1, 1, 1728381827.1851168]