TEST_NAME : Wafer
TEST_DATE : 24_10_08-12_04_18
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-037-002-011-03 | FUSED_ID : 6359364768411689139
  IC_TEMP :  -97.45 | VDDM : 1104.10 | AUX_INT :  -12.41 | CsaBias :   51.76
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.50818e-03 / 2
  ADC_P0  : -1.24054e-02 ± 3.40325e-02
  ADC_P1  : 9.21548e-03 ± 9.01290e-04
  ADC_P2  : -7.00042e-06 ± 4.78774e-06
  CSA_Chi2/NDF : 1.11202e-04 / 2
  CSA_P0  : 5.69925e-02 ± 7.03360e-03
  CSA_P1  : 1.01763e-02 ± 5.29931e-04
  CSA_P2  : -6.89917e-05 ± 8.07022e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [50, 53, 106]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1669', '1.800', '0.1595', '1.800', '0.0911', '7.000', '0.7083', 1, 1, 1, 1, 1728381858.4207783]
VI_after__Init : ['1.202', '0.1673', '1.800', '0.1596', '1.801', '0.0835', '7.000', '0.7075', 1, 1, 1, 1, 1728381866.6342711]
VI_at__the_End : ['1.201', '0.4221', '1.800', '0.1324', '1.800', '0.1225', '7.000', '0.7086', 1, 1, 1, 1, 1728381928.381021]