TEST_NAME : Wafer
TEST_DATE : 24_10_08-12_05_57
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-037-002-012-03 | FUSED_ID : 6359364768411689155
  IC_TEMP :  -74.54 | VDDM : 1119.05 | AUX_INT :  -10.12 | CsaBias :   61.97
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.70803e-03 / 2
  ADC_P0  : -1.01189e-02 ± 2.80214e-02
  ADC_P1  : 9.06817e-03 ± 7.31557e-04
  ADC_P2  : -7.16194e-06 ± 3.80127e-06
  CSA_Chi2/NDF : 2.42551e-04 / 2
  CSA_P0  : 5.73869e-02 ± 1.03878e-02
  CSA_P1  : 1.06493e-02 ± 7.82646e-04
  CSA_P2  : -6.27525e-05 ± 1.19188e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [82]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1366', '1.800', '0.1502', '1.800', '0.0823', '7.000', '0.7077', 1, 1, 1, 1, 1728381956.8349552]
VI_after__Init : ['1.201', '0.1366', '1.800', '0.1503', '1.800', '0.0771', '7.000', '0.7076', 1, 1, 1, 1, 1728381964.5724144]
VI_at__the_End : ['1.201', '0.4743', '1.800', '0.1381', '1.800', '0.1177', '7.000', '0.7083', 1, 1, 1, 1, 1728382027.612155]