TEST_NAME : Wafer
TEST_DATE : 24_10_08-12_07_35
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-037-002-013-03 | FUSED_ID : 6359364768411689171
  IC_TEMP :  -67.00 | VDDM : 1110.96 | AUX_INT :   -9.46 | CsaBias :   73.17
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.87653e-03 / 2
  ADC_P0  : -9.45632e-03 ± 2.94898e-02
  ADC_P1  : 8.30973e-03 ± 7.34464e-04
  ADC_P2  : -4.67925e-06 ± 3.65092e-06
  CSA_Chi2/NDF : 2.13334e-04 / 2
  CSA_P0  : 5.59246e-02 ± 9.74209e-03
  CSA_P1  : 1.02190e-02 ± 7.33996e-04
  CSA_P2  : -5.60372e-05 ± 1.11779e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [9, 12, 64]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [71]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4193', '1.800', '0.1204', '1.800', '0.0994', '7.000', '0.7082', 1, 1, 1, 1, 1728382055.3640103]
VI_after__Init : ['1.200', '0.4197', '1.800', '0.1203', '1.800', '0.0924', '7.000', '0.7076', 1, 1, 1, 1, 1728382063.652533]
VI_at__the_End : ['1.201', '0.4703', '1.800', '0.1356', '1.800', '0.1122', '7.000', '0.7080', 1, 1, 1, 1, 1728382124.9671464]