TEST_NAME : Wafer
TEST_DATE : 24_10_08-12_10_53
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-037-002-015-03 | FUSED_ID : 6359364768411689203
  IC_TEMP :  -62.45 | VDDM : 1118.23 | AUX_INT :   -8.95 | CsaBias :   76.50
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.37018e-03 / 2
  ADC_P0  : -8.94521e-03 ± 2.50710e-02
  ADC_P1  : 8.60868e-03 ± 6.26230e-04
  ADC_P2  : -6.40008e-06 ± 3.10200e-06
  CSA_Chi2/NDF : 1.34533e-04 / 2
  CSA_P0  : 5.76957e-02 ± 7.73637e-03
  CSA_P1  : 9.95277e-03 ± 5.82880e-04
  CSA_P2  : -4.89168e-05 ± 8.87657e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [28]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2125', '1.800', '0.1431', '1.800', '0.0840', '7.000', '0.7075', 1, 1, 1, 1, 1728382252.9631517]
VI_after__Init : ['1.202', '0.2125', '1.800', '0.1432', '1.800', '0.0786', '7.000', '0.7074', 1, 1, 1, 1, 1728382261.1335309]
VI_at__the_End : ['1.202', '0.4872', '1.800', '0.1341', '1.800', '0.1147', '7.000', '0.7079', 1, 1, 1, 1, 1728382329.7075722]