TEST_NAME : Wafer
TEST_DATE : 24_10_08-12_14_09
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-037-002-017-04 | FUSED_ID : 6359364768411689236
  IC_TEMP :  -68.01 | VDDM : 1118.79 | AUX_INT :   -7.86 | CsaBias :   61.41
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.72771e-04 / 2
  ADC_P0  : -7.85838e-03 ± 2.10588e-02
  ADC_P1  : 8.71619e-03 ± 5.25862e-04
  ADC_P2  : -7.15601e-06 ± 2.59423e-06
  CSA_Chi2/NDF : 1.85983e-04 / 2
  CSA_P0  : 5.83733e-02 ± 9.09619e-03
  CSA_P1  : 1.03204e-02 ± 6.85332e-04
  CSA_P2  : -5.45883e-05 ± 1.04368e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [62]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [0]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2365', '1.800', '0.1747', '1.800', '0.0913', '7.000', '0.7073', 1, 1, 1, 1, 1728382449.4817924]
VI_after__Init : ['1.202', '0.2364', '1.800', '0.1749', '1.800', '0.0858', '7.000', '0.7071', 1, 1, 1, 1, 1728382457.4881866]
VI_at__the_End : ['1.201', '0.4843', '1.800', '0.1366', '1.806', '0.1168', '7.000', '0.7079', 1, 1, 1, 1, 1728382523.1144407]