TEST_NAME : Wafer
TEST_DATE : 24_10_08-12_15_47
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-037-002-018-04 | FUSED_ID : 6359364768411689252
  IC_TEMP :  -65.01 | VDDM : 1121.77 | AUX_INT :   -8.92 | CsaBias :   83.44
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.38014e-03 / 2
  ADC_P0  : -8.91947e-03 ± 2.51455e-02
  ADC_P1  : 8.46739e-03 ± 6.13248e-04
  ADC_P2  : -6.48586e-06 ± 2.96009e-06
  CSA_Chi2/NDF : 1.65268e-04 / 2
  CSA_P0  : 5.58503e-02 ± 8.57466e-03
  CSA_P1  : 9.93391e-03 ± 6.46038e-04
  CSA_P2  : -4.78144e-05 ± 9.83840e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [20]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [76]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3884', '1.800', '0.1772', '1.800', '0.0923', '7.000', '0.7070', 1, 1, 1, 1, 1728382547.570693]
VI_after__Init : ['1.202', '0.3886', '1.800', '0.1773', '1.800', '0.0866', '7.000', '0.7069', 1, 1, 1, 1, 1728382555.805958]
VI_at__the_End : ['1.202', '0.4850', '1.799', '0.1347', '1.799', '0.1146', '7.000', '0.7076', 1, 1, 1, 1, 1728382613.5058]