TEST_NAME : Wafer
TEST_DATE : 24_10_08-12_17_26
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-037-002-019-04 | FUSED_ID : 6359364768411689268
  IC_TEMP :  -62.96 | VDDM : 1117.03 | AUX_INT :   -8.11 | CsaBias :   81.08
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.64956e-03 / 2
  ADC_P0  : -8.10890e-03 ± 2.75815e-02
  ADC_P1  : 8.16684e-03 ± 6.62782e-04
  ADC_P2  : -5.31361e-06 ± 3.16313e-06
  CSA_Chi2/NDF : 1.43422e-04 / 2
  CSA_P0  : 5.60896e-02 ± 7.98786e-03
  CSA_P1  : 9.69866e-03 ± 6.01828e-04
  CSA_P2  : -4.51258e-05 ± 9.16513e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [114, 116]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4033', '1.800', '0.1500', '1.800', '0.0934', '7.000', '0.7072', 1, 1, 1, 1, 1728382646.346326]
VI_after__Init : ['1.202', '0.4036', '1.800', '0.1498', '1.800', '0.0878', '7.000', '0.7069', 1, 1, 1, 1, 1728382654.411798]
VI_at__the_End : ['1.202', '0.4838', '1.800', '0.1333', '1.799', '0.1135', '7.000', '0.7077', 1, 1, 1, 1, 1728382718.8620083]