TEST_NAME : Wafer
TEST_DATE : 24_10_08-12_43_43
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-037-003-007-14 | FUSED_ID : 6359364768411693182
  IC_TEMP :  -71.31 | VDDM : 1108.80 | AUX_INT :  -10.88 | CsaBias :   64.61
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.91964e-03 / 2
  ADC_P0  : -1.08782e-02 ± 2.97082e-02
  ADC_P1  : 8.44423e-03 ± 7.19284e-04
  ADC_P2  : -6.23904e-06 ± 3.47268e-06
  CSA_Chi2/NDF : 2.44159e-04 / 2
  CSA_P0  : 5.55583e-02 ± 1.04222e-02
  CSA_P1  : 1.06785e-02 ± 7.85237e-04
  CSA_P2  : -6.22236e-05 ± 1.19582e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [69, 94, 103, 124]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [3, 79]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2082', '1.800', '0.1737', '1.800', '0.0870', '7.000', '0.7077', 1, 1, 1, 1, 1728384223.5877435]
VI_after__Init : ['1.201', '0.2082', '1.800', '0.1737', '1.800', '0.0814', '7.000', '0.7076', 1, 1, 1, 1, 1728384231.6652374]
VI_at__the_End : ['1.201', '0.4793', '1.800', '0.1380', '1.800', '0.1146', '7.000', '0.7086', 1, 1, 1, 1, 1728384299.472899]