TEST_NAME : Wafer
TEST_DATE : 24_10_08-12_42_05
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-037-003-008-14 | FUSED_ID : 6359364768411693198
  IC_TEMP :  -72.31 | VDDM : 1100.54 | AUX_INT :  -10.78 | CsaBias :   58.88
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.97193e-03 / 2
  ADC_P0  : -1.07849e-02 ± 3.01324e-02
  ADC_P1  : 8.76123e-03 ± 7.60502e-04
  ADC_P2  : -6.58439e-06 ± 3.82494e-06
  CSA_Chi2/NDF : 2.18714e-04 / 2
  CSA_P0  : 5.47996e-02 ± 9.86416e-03
  CSA_P1  : 1.01468e-02 ± 7.43194e-04
  CSA_P2  : -5.60753e-05 ± 1.13180e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [50, 115]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1418', '1.800', '0.1352', '1.800', '0.0825', '7.000', '0.7075', 1, 1, 1, 1, 1728384125.2035341]
VI_after__Init : ['1.202', '0.1418', '1.800', '0.1352', '1.800', '0.0768', '7.000', '0.7078', 1, 1, 1, 1, 1728384133.2889075]
VI_at__the_End : ['1.201', '0.4665', '1.800', '0.1381', '1.800', '0.1135', '7.000', '0.7085', 1, 1, 1, 1, 1728384193.5231657]