TEST_NAME : Wafer
TEST_DATE : 24_10_08-12_38_48
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-037-003-010-14 | FUSED_ID : 6359364768411693230
  IC_TEMP :  -61.79 | VDDM : 1103.03 | AUX_INT :  -10.18 | CsaBias :   64.68
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.62928e-03 / 2
  ADC_P0  : -1.01757e-02 ± 2.73491e-02
  ADC_P1  : 8.37180e-03 ± 6.59900e-04
  ADC_P2  : -6.04420e-06 ± 3.17141e-06
  CSA_Chi2/NDF : 1.65023e-04 / 2
  CSA_P0  : 5.79156e-02 ± 8.56831e-03
  CSA_P1  : 9.63766e-03 ± 6.45560e-04
  CSA_P2  : -4.62818e-05 ± 9.83112e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [19, 59]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [3]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.0588', '1.800', '0.1651', '1.799', '0.0753', '7.000', '0.7076', 1, 1, 1, 1, 1728383928.562192]
VI_after__Init : ['1.201', '0.0588', '1.800', '0.1650', '1.800', '0.0702', '7.000', '0.7075', 1, 1, 1, 1, 1728383936.7154791]
VI_at__the_End : ['1.202', '0.4778', '1.800', '0.1378', '1.801', '0.1136', '7.000', '0.7083', 1, 1, 1, 1, 1728383991.5940876]