TEST_NAME : Wafer
TEST_DATE : 24_10_08-12_35_31
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-037-003-012-14 | FUSED_ID : 6359364768411693262
  IC_TEMP :  -65.62 | VDDM : 1125.83 | AUX_INT :   -6.16 | CsaBias :   60.65
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.04957e-03 / 2
  ADC_P0  : -6.16040e-03 ± 2.19697e-02
  ADC_P1  : 8.39358e-03 ± 5.54038e-04
  ADC_P2  : -5.34438e-06 ± 2.75448e-06
  CSA_Chi2/NDF : 1.62870e-04 / 2
  CSA_P0  : 5.82447e-02 ± 8.51223e-03
  CSA_P1  : 9.67681e-03 ± 6.41335e-04
  CSA_P2  : -4.59600e-05 ± 9.76678e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [25, 26]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [31, 87]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2054', '1.800', '0.1715', '1.799', '0.0919', '7.000', '0.7076', 1, 1, 1, 1, 1728383731.7310057]
VI_after__Init : ['1.201', '0.2055', '1.800', '0.1716', '1.800', '0.0868', '7.000', '0.7075', 1, 1, 1, 1, 1728383739.7474325]
VI_at__the_End : ['1.201', '0.4809', '1.800', '0.1356', '1.800', '0.1160', '7.000', '0.7082', 1, 1, 1, 1, 1728383801.378811]