TEST_NAME : Wafer
TEST_DATE : 24_10_08-12_30_36
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-037-003-015-14 | FUSED_ID : 6359364768411693310
  IC_TEMP :  -61.33 | VDDM : 1103.60 | AUX_INT :  -10.37 | CsaBias :   83.15
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.72173e-03 / 2
  ADC_P0  : -1.03721e-02 ± 2.80941e-02
  ADC_P1  : 8.57668e-03 ± 6.86005e-04
  ADC_P2  : -6.79357e-06 ± 3.32940e-06
  CSA_Chi2/NDF : 1.15611e-04 / 2
  CSA_P0  : 5.71518e-02 ± 7.17169e-03
  CSA_P1  : 9.37611e-03 ± 5.40335e-04
  CSA_P2  : -4.12366e-05 ± 8.22866e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [90]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [2, 3, 24, 30, 41, 86]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.0773', '1.800', '0.1313', '1.800', '0.0887', '7.000', '0.7072', 1, 1, 1, 1, 1728383436.0643833]
VI_after__Init : ['1.202', '0.0773', '1.800', '0.1313', '1.800', '0.0833', '7.000', '0.7073', 1, 1, 1, 1, 1728383444.1376908]
VI_at__the_End : ['1.201', '0.4805', '1.800', '0.1356', '1.800', '0.1132', '7.000', '0.7081', 1, 1, 1, 1, 1728383503.3692884]